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				|  | Si (Silicon) シリコン(Si)はエレクトロニクス産業を支える重要な材料であり主に半導体素子や集積回路の原材料などに利用されている。 
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				|  | Si- Main Properties |  |  | 
			
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							| 応用 | Diode, Transistor, IC, VLSI…etc |  
							| クラス/結晶構造 | Diamond |  
							| 育成方法 | FZ/CZ method |  
							| 格子定数、Å | 5.40 |  
							| バンドギャップ,Eg(eV) | 1.11 |  
							| 融点,℃ | 1412 |  |  |  | 
			
				|  | Typical Properties: |  |  | 
			
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							| Parameters / dopant | B doped | P doped | Undoped |  
							| Conductor type | P | N | P |  
							| Resistivity (Ω.cm) | 10-3 ~ 40 | 10-3 ~ 40 | 102 ~ 104 |  
							| EPD (cm-2 ) | ≦ 100 | ≦ 100 | ≦ 100 |  
							| Vortex Defects | 0 | 0 | 0 |  
							| Oxygen Content ( /cm3 ) | ≦ 1 ~ 1.8 x1018 | ≦ 1 ~ 1.8 x1018 | ≦ 1 ~ 1.8 x1018 |  
							| Carbon Content ( /cm3 ) | ≦ 5x1016 | ≦ 5x1016 | ≦ 5x1016 |  
							| Boule Diameter | 1 ~ 8 ” | 1 ~ 8 ” | 1 ~ 8 ” |  
							| Standard orientation | <100>, <111>, <110> | <100>, <111>, <110> | <100>, <111>, <110> |  |  |  | 
			
				|  | Recommended Applications: |  |  | 
			
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							| Wafer Resistivity, ( Ω.cm) | < 0.05 | 1 ~ 5 | 6 ~ 12 | > 30 |  
							| Application | Epitaxial substrate | Solar cell | IC, OE devices or sensors | Special device or component |  |  |  | 
			
				|  | Standard Size: |  |  | 
			
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							| Diameter | Thickness (μm) | Polished surfaces | Orientation |  
							| 1” | 300 | One side or Two sides | <100>, <111>, <110> |  
							| 2” | 350 |  
							| 3” | 500 |  
							| 4” | 500 |  
							| 8 “ | 750 |  |  |  | 
			
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				|  | お問い合わせ |  | 株式会社ネオトロン |  | 
			
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